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Submission guidelines

Our 3-step submission process

  1. Before you submit

    Before you submit, we recommend familiarizing yourself with the following.

  2. Ready to submit

    To give your manuscript the best chance of publication, follow these editorial policies and formatting guidelines.

  3. Submit and promote

    After acceptance, we provide support so your article gains maximum impact in the scientific community and beyond.

Submit manuscript

Affiliated with

  • The Institute of Information Engineering (IIE) is a national research institute in Beijing that specializes in comprehensive research on theories and applications related to information technology.

    IIE strives to be a leading global academic institution by creating first-class research platforms and attracting top researchers. It also seeks to become an important national strategic power in the field of information technology.

    IIE’s mission is to promote China’s innovation and industrial competitiveness by advancing information science, standards, and technology in ways that enhance economic security and public safety as well as improve our quality of life.

    Read more..

The journal is indexed by

  • EI Compendex
  • Emerging Sources Citation Index
  • DBLP
  • DOAJ
  • SCOPUS
  • EBSCO Discovery Service
  • Gale
  • INSPEC
  • Institute of Scientific and Technical Information of China
  • Google Scholar
  • Dimensions
  • CNKI
  • Naver
  • Norwegian Register for Scientific Journals and Series
  • OCLC WorldCat Discovery Service
  • ProQuest-ExLibris Primo
  • ProQuest-ExLibris Summon
  • TD Net Discovery Service
  • UGC-CARE List (India)

Annual Journal Metrics

  • 2022 Citation Impact
    3.1 - 2-year Impact Factor
    4.8 - 5-year Impact Factor
    2.071 - SNIP (Source Normalized Impact per Paper)
    1.266 - SJR (SCImago Journal Rank)

    2023 Speed
    8 days submission to first editorial decision for all manuscripts (Median)
    95 days submission to accept (Median)

    2023 Usage 
    408,523 downloads
    15 Altmetric mentions